Optical characterization of van der Waals materials via near-field microscopy
Publication information:
Wintz D, Zhu AY, Wang K, Ambrosio A, Devlin R, Crossno J, Kim P, Capasso F. Optical characterization of van der Waals materials via near-field microscopy.
In Conference on Lasers and Electro-Optics. OSA; 2016.